Product Introduction
V-HS1M
V-HS1M
Applicable substrate
Very low loss
Low loss
高速数字电路(HSD)
Low loss
高速数字电路(HSD)
Typical characteristics
超低粗糙度
高信号完整性(SI)
高信号完整性(SI)
NRC product information
Representative feature data
This test adopts the IPC-TM-650 standard, and the roughness detection instrument is Mar 5 μ Roughness meter,
PP models S0401, S1000HB, S1150GB, S1170GB
